发明名称 FINFET STRUCTURE AND METHOD FOR MANUFACTURING THEREOF
摘要 Present disclosure provides a FinFET structure, including a plurality of fins, a gate, and a first dopant layer. The gate is disposed substantially orthogonal over the plurality of fins, covering a portion of a top surface and a portion of sidewalls of the plurality of fins. The first dopant layer covers the top surface and the sidewalls of a junction portion of a first fin, configured to provide dopants of a first conductive type to the junction portion of the first fin. The junction portion is adjacent to the gate.
申请公布号 US2017077269(A1) 申请公布日期 2017.03.16
申请号 US201615358953 申请日期 2016.11.22
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD. 发明人 TSAI CHUN HSIUNG;NI CHUN-LUNG;CHEN KEI-WEI
分类号 H01L29/66;H01L21/324;H01L27/092;H01L21/311;H01L21/8238;H01L29/78;H01L21/225;H01L21/02 主分类号 H01L29/66
代理机构 代理人
主权项 1. A method for manufacturing a FinFET structure, comprising: forming a plurality of semiconductor fins; forming a diffusion barrier over a top surface and a sidewall of a first set of a plurality of semiconductor fins; forming a first dopant layer over a top surface and a sidewall of a second set of the plurality of semiconductor fins, the first dopant layer comprising dopants of a first conductive type; diffusing the dopants of the first conductive type into the second set of the plurality of semiconductor fins by an annealing operation, wherein the dopant concentration of the dopants of the first conductive type in proximity to the top surface is controlled to be substantially identical to the dopant concentration of the dopants of the first conductive type in proximity to a bottom sidewall of the second set of the plurality of the semiconductor fins.
地址 HSINCHU TW