发明名称 SEMICONDUCTOR MEMORY DEVICE AND METHOD FOR MANUFACTURING THE SAME
摘要 According to one embodiment, a semiconductor memory device includes a structural body, first to fourth pillars, a first interconnection, a second interconnection, a third interconnection, and a fourth interconnection. The first to fourth pillars provides within the structural body extending along the first direction. A first distance between the first pillar and the first interconnection is greater than a second distance between the third pillar and the third interconnection. The first distance is greater than a third distance between the fourth pillar and the fourth interconnection. A fourth distance between the second pillar and the second interconnection is greater than the second distance. The fourth distance is greater than the third distance.
申请公布号 US2017077124(A1) 申请公布日期 2017.03.16
申请号 US201615013153 申请日期 2016.02.02
申请人 Kabushiki Kaisha Toshiba 发明人 SHIMOJO Yoshiro
分类号 H01L27/115;H01L21/768;H01L23/528 主分类号 H01L27/115
代理机构 代理人
主权项 1. A semiconductor memory device comprising: a structural body including a plurality of electrode layers arranged in a first direction; a first pillar, a second pillar, a third pillar, and a fourth pillar provided in the structural body, the first to fourth pillars extending along the first direction in the structural body; a first interconnection extending in a second direction and electrically connected to the first pillar, the second direction crossing the first direction; a second interconnection extending in the second direction and electrically connected to the second pillar; a third interconnection extending in the second direction and electrically connected to the third pillar; and a fourth interconnection extending in the second direction and electrically connected to the fourth pillar; a first distance between the first pillar and the first interconnection in the first direction being greater than a second distance between the third pillar and the third interconnection in the first direction, and the first distance being greater than a third distance between the fourth pillar and the fourth interconnection in the first direction, and a fourth distance between the second pillar and the second interconnection in the first direction being greater than the second distance, the fourth distance being greater than the third distance.
地址 Minato-ku JP