发明名称 ACCESS LINE MANAGEMENT IN A MEMORY DEVICE
摘要 Memory devices are configured to store a number of access line biasing patterns to be applied during a memory device operation performed on a particular row of memory cells in the memory device. Memory devices are further configured to support modification of the stored bias patterns, providing flexibility in biasing access lines through changes to the bias patterns stored in the memory device. Methods and devices further facilitate performing memory device operations under multiple biasing conditions to evaluate and characterize the memory device by adjustment of the stored bias patterns without requiring an associated hardware change to the memory device.
申请公布号 US2017076806(A1) 申请公布日期 2017.03.16
申请号 US201615342255 申请日期 2016.11.03
申请人 MICRON TECHNOLOGY, INC. 发明人 Louie Benjamin;Mohammadzadeh Ali;Yip Aaron S.
分类号 G11C16/24;G11C16/04;G11C16/08;G11C16/14;G11C16/26 主分类号 G11C16/24
代理机构 代理人
主权项 1. A memory device, comprising: an array of memory cells; one or more first registers, each first register associated with a respective one of a plurality of access lines; one or more second registers, each second register associated with a respective one of the plurality of access lines; control circuitry, wherein the control circuitry is configured to load each first register with respective first bias information responsive to the selection of a particular access line of the plurality of access lines for a memory device operation when the memory device is in a first mode of operation; and driver circuitry configured to bias each of the access lines of the plurality of access lines responsive to the respective first bias information when the memory device is in the first mode of operation and bias each of the access lines of the plurality of access lines responsive to respective second bias information when the memory device is in a second mode of operation; wherein the first bias information is determined using the second mode of operation.
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