发明名称 |
FINFET DEVICE AND METHOD FOR FABRICATING THE SAME |
摘要 |
A semiconductor device includes a semiconductor substrate, a plurality of semiconductor fins and a source/drain structure. The semiconductor fins and the source/drain structure are located on the semiconductor substrate, and the source/drain structure is connected to the semiconductor fins. The source/drain structure has a top portion with a W-shape cross section for forming a contact landing region. The semiconductor device may further include a plurality of capping layers located on a plurality of recessed portions of the top portion. |
申请公布号 |
US2017077228(A1) |
申请公布日期 |
2017.03.16 |
申请号 |
US201514850726 |
申请日期 |
2015.09.10 |
申请人 |
TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. |
发明人 |
LEE Yen-Ru;LI Chii-Horng;KUO Chien-I;TING Heng-Wen;TAI Jung-Chi;SU Lilly;HSIAO Yang-Tai |
分类号 |
H01L29/08;H01L21/8234;H01L29/66;H01L29/78;H01L27/088 |
主分类号 |
H01L29/08 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor device, comprising:
a semiconductor substrate; a source structure located on the semiconductor substrate; a drain structure located on the semiconductor substrate; and a plurality of semiconductor fins protruding from the semiconductor substrate, wherein the semiconductor fins are spaced apart from each other, and connect the source structure and the drain structure; wherein each of the source structure and the drain structure has a top portion with a W-shape cross section for forming a contact landing region. |
地址 |
Hsinchu TW |