发明名称 FINFET DEVICE AND METHOD FOR FABRICATING THE SAME
摘要 A semiconductor device includes a semiconductor substrate, a plurality of semiconductor fins and a source/drain structure. The semiconductor fins and the source/drain structure are located on the semiconductor substrate, and the source/drain structure is connected to the semiconductor fins. The source/drain structure has a top portion with a W-shape cross section for forming a contact landing region. The semiconductor device may further include a plurality of capping layers located on a plurality of recessed portions of the top portion.
申请公布号 US2017077228(A1) 申请公布日期 2017.03.16
申请号 US201514850726 申请日期 2015.09.10
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 LEE Yen-Ru;LI Chii-Horng;KUO Chien-I;TING Heng-Wen;TAI Jung-Chi;SU Lilly;HSIAO Yang-Tai
分类号 H01L29/08;H01L21/8234;H01L29/66;H01L29/78;H01L27/088 主分类号 H01L29/08
代理机构 代理人
主权项 1. A semiconductor device, comprising: a semiconductor substrate; a source structure located on the semiconductor substrate; a drain structure located on the semiconductor substrate; and a plurality of semiconductor fins protruding from the semiconductor substrate, wherein the semiconductor fins are spaced apart from each other, and connect the source structure and the drain structure; wherein each of the source structure and the drain structure has a top portion with a W-shape cross section for forming a contact landing region.
地址 Hsinchu TW