发明名称 X-RAY SMALL ANGLE OPTICAL SYSTEM
摘要 Provided is an X-ray small angle optical system, which easily achieves a desired angular resolution, including: an X-ray source having a microfocus; a multilayer mirror having an elliptical reflection surface, and being configured to collect X-rays emitted from the X-ray source and to irradiate a sample; and an X-ray detector configured to detect scattered X-rays generated from the sample, in which the elliptical reflection surface of the multilayer mirror has a focal point A and a focal point B, in which the X-ray source is arranged such that the microfocus includes the focal point A, and in which the X-ray detector is arranged on the multilayer mirror side of the focal point B.
申请公布号 US2017074809(A1) 申请公布日期 2017.03.16
申请号 US201615259581 申请日期 2016.09.08
申请人 Rigaku Corporation 发明人 ITO Kazuki;OMOTE Kazuhiko;Jiang Licai
分类号 G01N23/201 主分类号 G01N23/201
代理机构 代理人
主权项 1. An X-ray small angle optical system, comprising: an X-ray source having a microfocus; a multilayer mirror having an elliptical reflection surface, and being configured to collect X-rays emitted from the X-ray source and to irradiate a sample; and an X-ray detector configured to detect scattered X-rays generated from the sample, wherein the elliptical reflection surface of the multilayer mirror has a focal point A and a focal point B, wherein the X-ray source is arranged such that the microfocus includes the focal point A, and wherein the X-ray detector is arranged on the multilayer mirror side of the focal point B.
地址 Tokyo JP