发明名称 顕微鏡撮像光線路の球面収差を識別し補正する方法及び装置
摘要 A method and apparatus provide identification of a spherical error of a microscope imaging beam path in a context of microscopic imaging of a sample using a microscope having an objective. A coverslip that carries or covers the sample is arranged in the imaging beam path. A measurement beam is guided through the objective onto the sample in a decentered fashion that is outside an optical axis of the objective. The measurement beam is reflected at an interface of the coverslip with the sample and the reflected measurement beam is guided through the objective onto a detector. An intensity profile of the reflected measurement beam is detected with the detector and a presence of a spherical error from the intensity profile is determined qualitatively and/or quantitatively.
申请公布号 JP6097516(B2) 申请公布日期 2017.03.15
申请号 JP20120224044 申请日期 2012.10.09
申请人 ライカ マイクロシステムス ツェーエムエス ゲーエムベーハー 发明人 ヴェルナー クネーベル;トービアス バウアー;ペーター オイテノイヤー
分类号 G02B21/00;G02B7/04 主分类号 G02B21/00
代理机构 代理人
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