发明名称 半導体装置及びその製造方法
摘要 A semiconductor device includes a channel layer protruding from a substrate and having protrusions extending from a sidewall thereof. Floating gates surrounding the channel layer are provided between the protrusions. Control gates surrounding the floating gates are stacked along the channel layer. Interlayer insulating layers are interposed between the control gates stacked along the channel layer. A level difference exists between a lateral surface of each of the floating gates, and a lateral surface of each of the protrusions.
申请公布号 JP6095951(B2) 申请公布日期 2017.03.15
申请号 JP20120246969 申请日期 2012.11.09
申请人 エスケーハイニックス株式会社SK hynix Inc.;国立大学法人東北大学 发明人 徐 文 植;遠藤 哲郎
分类号 H01L27/115;H01L21/336;H01L29/788;H01L29/792 主分类号 H01L27/115
代理机构 代理人
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