发明名称 半導体記憶装置及び半導体集積回路装置
摘要 A memory control circuit 10 controls an operation of reading stored data from a memory cell 50 connected to a word line WL and a bit line BL based on an address Address including a row address Ax and a column address Ay. When the address Address includes redundancy addresses P1 to P4 designating a word line WLa or a bit line BLc connected to a specific memory cell Cc, redundancy decoders 13-1 to 13-4 replace the specific memory cell Cc with a redundancy memory cell RCc connected to redundancy word lines RWL1 and RWL2 or redundancy bit lines RBL1 and RBL2. Redundancy address latch circuits 12-1 to 12-4 respectively hold the redundancy addresses P1 to P4, and erase the held redundancy addresses P1 to P4 based on a reset signal RS inputted from the memory control circuit 10.
申请公布号 JP6097775(B2) 申请公布日期 2017.03.15
申请号 JP20150027909 申请日期 2015.02.16
申请人 力晶科技股▲ふん▼有限公司 发明人 高杉 敦
分类号 G11C29/00 主分类号 G11C29/00
代理机构 代理人
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