发明名称 METHOD FOR ALTERING ONE OR MORE PARAMETERS OF A MEASUREMENT SYSTEM
摘要 Methods for altering one or more parameters of a measurement system are provided. One method includes analyzing a sample using the system to generate values from classification channels of the system for a population of particles in the sample. The method also includes identifying a region in a classification space in which the values for the populations are located. In addition, the method includes determining an optimized classification region for the population using one or more properties of the region. The optimized classification region contains a predetermined percentage of the values for the population. The optimized classification region is used for classification of particles in additional samples.
申请公布号 EP1704401(B1) 申请公布日期 2017.03.15
申请号 EP20050705266 申请日期 2005.01.07
申请人 Luminex Corporation 发明人 CALVIN, Edward
分类号 G01N15/14;G06K9/00;G06K9/62 主分类号 G01N15/14
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