发明名称 質量分析装置
摘要 The objective of the present invention is to obtain an MS 2 spectrum for each of a plurality of different ion species even when their m/z values are extremely close to each other and prevent separate setting of each ion species as the precursor ion. In the vicinity of the target m/z, a precursor-ion selection window covering a predetermined m/z range (2×”M) is gradually shifted in predetermined steps (”m) to define a plurality of windows as the condition of the precursor-ion selection. When an MS 2 analysis is performed on the same sample for each window, the intensities of the product-ion peaks which appear on the MS 2 spectrum change with the change in the central m/z value of the window. From this intensity change, which of the plurality of ion species selected as the precursor ion is the origin of each product ion is determined. Based on the result of this determination, the product ions are sorted out and an MS 2 spectrum is reconstructed for each ion species.
申请公布号 JP6090479(B2) 申请公布日期 2017.03.08
申请号 JP20150557627 申请日期 2014.01.16
申请人 株式会社島津製作所 发明人 山口 真一
分类号 H01J49/42;G01N27/62 主分类号 H01J49/42
代理机构 代理人
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