发明名称 PHOTOTHERMAL EXAMINATION METHOD AND CORRESPONDING EXAMINATION UNIT
摘要 A photothermal examination method and corresponding examination unit are provided. In the method first and second zones of the surface to be characterized are scanned simultaneously, and first and second photosensitive surfaces separate from one another acquire images of the infrared radiation emitted by these two zones.
申请公布号 EP3137887(A1) 申请公布日期 2017.03.08
申请号 EP20150718920 申请日期 2015.04.29
申请人 AREVA NP 发明人 CAULIER, Yannick;TAGLIONE, Matthieu
分类号 G01N25/72 主分类号 G01N25/72
代理机构 代理人
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