发明名称 フォトマスク、フォトマスクの製造方法及びパターンの転写方法
摘要 PROBLEM TO BE SOLVED: To provide a photomask with which a fine pattern can be accurately and precisely transferred, and to provide a transfer method and a method for manufacturing a flat panel display.SOLUTION: The photomask has a transfer pattern formed on a transparent substrate, wherein the transfer pattern includes a light-shielding part that blocks at least a part of exposure light and a light-transmitting part exposing the transparent substrate. The light-shielding part includes an edge region formed along an outer periphery of the light-shielding part with a predetermined width, and a center region formed in a part except for the edge region of the light-shielding part. The center region is formed to give an about 180 degrees of a phase shift amount to light at a representative wavelength included in the exposure light that transmits through the light-transmitting part, while the edge region is formed to give a phase shift amount smaller than that of the center region to the light at the representative wavelength. An optical film having 50% or less of a transmittance with respect to the light at the representative wavelength is formed in the edge region.
申请公布号 JP6093117(B2) 申请公布日期 2017.03.08
申请号 JP20120126114 申请日期 2012.06.01
申请人 HOYA株式会社 发明人 今敷 修久
分类号 G03F1/28 主分类号 G03F1/28
代理机构 代理人
主权项
地址