| 摘要 |
In an image inspection apparatus, an image pickup part acquires an inspection image by capturing an image, whereas a reference image is generated based on original image data. A first accumulation part acquires a reference accumulated value distribution by accumulating values of pixels in the reference image that are arranged in an image recording direction. A second accumulation part acquires an inspection accumulated value distribution by accumulating values of pixels in the inspection image that are arranged in the image recording direction. A sensitivity correction part performs sensitivity correction in which a plurality of accumulated values other than a local peak in the inspection accumulated value distribution are corrected so as to relatively approach a plurality of corresponding accumulated values in the reference accumulated value distribution, based on a ratio between the inspection accumulated value distribution from which the local peak has been removed and the reference accumulated value distribution. A comparison part subtracts the reference accumulated value distribution from the inspection accumulated value distribution that has undergone the sensitivity correction, and thereby, a defect is detected. In this way, with the image inspection apparatus, the inspection accuracy is improved by performing sensitivity correction on the inspection accumulated value distribution. |
