发明名称 Methods for performing thermal melt analysis
摘要 The present disclosure provides apparatus, systems, and methods for conducting rapid, accurate, and consistent heated amplifications and/or thermal melt analyses.
申请公布号 US9588069(B2) 申请公布日期 2017.03.07
申请号 US201313956060 申请日期 2013.07.31
申请人 GEN-PROBE INCORPORATED 发明人 Opalsky David;Hagen Norbert D.;Silbert Rolf;Chiu Sean Siyao;Li Haitao
分类号 C12Q1/68;G01N25/04;B01L7/00;G01N21/64;B01L9/06 主分类号 C12Q1/68
代理机构 代理人 Cappellari Charles B.;Devernoe David L.;Wydeven Richard
主权项 1. A method for performing a thermal melt analysis on the contents of a receptacle contained within a thermal melt analysis module, the method comprising the steps of: (a) bringing a receptacle into thermal contact with a thermal block contained within the thermal melt analysis module, wherein the contents of the receptacle are at an initial temperature that is lower than the temperature of the thermal block when the receptacle is brought into thermal contact with the thermal block; (b) allowing the receptacle to dwell in thermal contact with the thermal block for a predetermined dwell period so that the temperature of the contents of the receptacle increases from the initial temperature to a temperature that is higher than the initial temperature; (c) during step (b), periodically measuring an optical signal emitted from the contents of the receptacle as the temperature of the contents of the receptacle increases; (d) detecting a change, if any, in the measured optical signal during step (c); and (e) removing the receptacle from the thermal melt analysis module, wherein the thermal block is maintained at a steady-state temperature during steps (a)-(d).
地址 San Diego CA US