System and method for testing an integrated circuit

摘要

In accordance with an embodiment, a method of testing an integrated circuit, includes receiving a supply voltage on the integrated circuit via a first input pin, providing power to circuits disposed on the integrated circuit via the first input pin, comparing the supply voltage to an internally generated voltage, generating a digital output value based on the comparing, and applying the digital output value to a pin of the integrated circuit.

主权项

1. A method of testing an integrated circuit, the method comprising:
receiving a supply voltage on the integrated circuit via a first input pin; providing power to circuits disposed on the integrated circuit via the first input pin; comparing, by a data converter of the integrated circuit, the supply voltage to a voltage internally generated by a first circuit of the integrated circuit; providing, by the data converter, a first output value in accordance with a voltage difference between the supply voltage and the internally generated voltage; generating, by a digital interface of the integrated circuit, a digital output value based on the first output value; and applying the digital output value to a pin of the integrated circuit such that the digital output value is readable in a test mode.