发明名称 |
Contact pad for semiconductor devices |
摘要 |
Packaging devices and methods of manufacture thereof for semiconductor devices are disclosed. In some embodiments, a packaging device includes a contact pad disposed over a substrate, and a passivation layer and/or polymer layer disposed over the substrate and a portion of the contact pad. A post passivation interconnect (PPI) line is disposed over the passivation layer and is coupled to an exposed portion of the contact pad. A PPI pad is disposed over the passivation layer. A transition element is disposed over the passivation layer and is coupled between the PPI line and the PPI pad. The transition element includes line having a width greater than the PPI line. |
申请公布号 |
US9589891(B2) |
申请公布日期 |
2017.03.07 |
申请号 |
US201514946517 |
申请日期 |
2015.11.19 |
申请人 |
Taiwan Semiconductor Manufacturing Company, Ltd. |
发明人 |
Chen Hsien-Wei;Chen Jie;Chen Ying-Ju |
分类号 |
H01L23/48;H01L23/52;H01L29/40;H01L23/528;H01L21/768;H01L23/31;H01L23/00;H01L23/525 |
主分类号 |
H01L23/48 |
代理机构 |
Slater Matsil, LLP |
代理人 |
Slater Matsil, LLP |
主权项 |
1. A semiconductor structure comprising:
a substrate having a contact pad thereon; an insulating layer over the substrate, wherein a portion of the contact pad is exposed; and a conductive interconnect electrically coupled between the contact pad and an external connection, the conductive interconnect having a first line portion, a pad portion, and a second line portion interposed between the first line portion and the pad portion, a width of the second line portion being greater than a width of the first line portion, the second line portion having substantially parallel sidewalls. |
地址 |
Hsin-Chu TW |