Inspection probe and an IC socket with the same

摘要

An inspection probe 16Ai is formed by subjecting a thin sheet material made of a copper alloy to press working. The inspection probe 16Ai includes: a device side plunger 16A having a contact point which selectively comes into contact with an electrode portion DVb of a semiconductor device DV; a board side plunger 16B having a contact point which selectively comes into contact with a contact pad of a printed wiring board 18; a spring portion 16D which biases the device side plunger 16A and the board side plunger 16B in a direction away from each other; and a cylindrical support stem 16C being disposed inside the spring portion 16D, making the spring portion 16D slidable thereon, and being configured to retain straight advancing property of the spring portion 16D.

主权项

1. An inspection probe comprising:
a first plunger formed from a copper alloy material, and having a contact point configured to selectively come into contact with an electrode portion of an object to be inspected; a second plunger formed from the copper alloy material, and having a contact point configured to selectively come into contact with an electrode portion of a wiring board; a spring portion formed integrally with one end of the first plunger and a first end of the second plunger, the spring portion being configured to bias the first plunger and the second plunger in a direction away from each other; and a support stem formed into a cylindrical shape integrally with the contact point of a second end of the second plunger, the second end being opposite to the first end, the support stem extending from the second end and being folded back toward the first end in such a manner as to be disposed inside the spring portion with a predetermined clearance in between, and configured to slidably guide the spring portion, wherein when the contact point of the first plunger comes into contact with the electrode portion of the object to be inspected, one end of the support stem inserted into an inner peripheral portion of the first plunger comes into sliding contact with the inner peripheral portion of the first plunger.