发明名称 NON-CONTACT VOLTAGE MEASUREMENT DEVICE
摘要 There is provided a non-contact voltage measurement device which can precisely measure a measurement target voltage by suppressing a flow of a leakage current via a parasitic capacitance produced between an electric field shield and an electric circuit. A drive voltage applying unit applies a voltage generated from an output voltage of a low impedance unit of the electric circuit and equal to an input voltage of a high impedance unit, to a first electric field shield coated on the high impedance unit.
申请公布号 US2017059619(A1) 申请公布日期 2017.03.02
申请号 US201515119400 申请日期 2015.02.04
申请人 OMRON Corporation 发明人 IMAI Hiroshi;MATSUURA Keiki;TOKUSAKI Hiroyuki;OGIMOTO Mao
分类号 G01R15/16 主分类号 G01R15/16
代理机构 代理人
主权项 1. A non-contact voltage measurement device configured to, when placing a probe close to and in non-contact with a conductive wire to produce a coupling capacitance between the probe and the conductive wire, measure a measurement target voltage applied to the conductive wire based on a voltage signal input to an electric circuit via the probe, wherein the electric circuit includes a first impedance unit and a second impedance unit of different impedance values, the first impedance unit in the electric circuit is arranged at a position closer to the probe than the second impedance unit is, and the non-contact voltage measurement device comprises: a first electric field shield configured to block an electric field entering the first impedance unit by coating at least part of the first impedance unit; and a voltage signal applying unit configured to generate an equivoltage signal equal to a voltage signal of the first impedance unit from a voltage signal of the second impedance unit, and configured to apply the generated equivoltage signal to the first electric field shield.
地址 Kyoto-shi, KYOTO JP