发明名称 ARRAY TEST DEVICE AND ARRAY TEST METHOD FOR DISPLAY PANEL
摘要 An array test device for a display panel includes a stage on which the display panel including a plurality of pixel circuits is disposed, a contact unit including a plurality of probe pins, an adjustment unit which adjusts the contact unit such that the probe pins contact a plurality of pads of the display panel, and a testing unit which applies an array test signal to the pixel circuits of the display panel through the probe pins and the pads, receives a test result signal from the pixel circuits through the pads and the probe pins, generates waveform information representing a waveform of the test result signal, and determines whether the pixel circuits are defective based on the waveform information.
申请公布号 US2017064297(A1) 申请公布日期 2017.03.02
申请号 US201615058659 申请日期 2016.03.02
申请人 Samsung Display Co., LTD. 发明人 KIM Joon-Geol;KIM Si-Joon;KIM Hee-Seon
分类号 H04N17/00 主分类号 H04N17/00
代理机构 代理人
主权项 1. An array test device for a display panel, the array test device comprising: a stage on which the display panel including a plurality of pixel circuits is disposed; a contact unit including a plurality of probe pins; an adjustment unit which adjusts the contact unit such that the plurality of probe pins contact a plurality of pads of the display panel; and a testing unit which applies an array test signal to the plurality of pixel circuits of the display panel through the plurality of probe pins and the plurality of pads, receives a test result signal from the plurality of pixel circuits through the plurality of pads and the plurality of probe pins, generates waveform information representing a waveform of the test result signal, and determines whether the plurality of pixel circuits is defective based on the waveform information.
地址 Yongin-si KR