发明名称 |
ARRAY TEST DEVICE AND ARRAY TEST METHOD FOR DISPLAY PANEL |
摘要 |
An array test device for a display panel includes a stage on which the display panel including a plurality of pixel circuits is disposed, a contact unit including a plurality of probe pins, an adjustment unit which adjusts the contact unit such that the probe pins contact a plurality of pads of the display panel, and a testing unit which applies an array test signal to the pixel circuits of the display panel through the probe pins and the pads, receives a test result signal from the pixel circuits through the pads and the probe pins, generates waveform information representing a waveform of the test result signal, and determines whether the pixel circuits are defective based on the waveform information. |
申请公布号 |
US2017064297(A1) |
申请公布日期 |
2017.03.02 |
申请号 |
US201615058659 |
申请日期 |
2016.03.02 |
申请人 |
Samsung Display Co., LTD. |
发明人 |
KIM Joon-Geol;KIM Si-Joon;KIM Hee-Seon |
分类号 |
H04N17/00 |
主分类号 |
H04N17/00 |
代理机构 |
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代理人 |
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主权项 |
1. An array test device for a display panel, the array test device comprising:
a stage on which the display panel including a plurality of pixel circuits is disposed; a contact unit including a plurality of probe pins; an adjustment unit which adjusts the contact unit such that the plurality of probe pins contact a plurality of pads of the display panel; and a testing unit which applies an array test signal to the plurality of pixel circuits of the display panel through the plurality of probe pins and the plurality of pads, receives a test result signal from the plurality of pixel circuits through the plurality of pads and the plurality of probe pins, generates waveform information representing a waveform of the test result signal, and determines whether the plurality of pixel circuits is defective based on the waveform information. |
地址 |
Yongin-si KR |