发明名称 SAMPLE HOLDER AND SAMPLE HOLDER SET
摘要 Disclosed herein is a sample holder which holds a sample such that a surface is exposed and can be mounted in each of multiple measurement devices that perform measurement based on different measurement principles so that properties of the sample can be measured by each of the measurement devices. The sample holder includes: a main body that surrounds the sample; alignment marks that are arranged at each of two or more different positions in a surface of the main body and can be detected by the measurement devices; and a sample-retaining portion that is disposed within the main body and retains the sample such that a height difference between a mark surface of the alignment mark and the surface of the sample is set to a predetermined value.
申请公布号 US2017062175(A1) 申请公布日期 2017.03.02
申请号 US201615193922 申请日期 2016.06.27
申请人 HITACHI HIGH-TECH SCIENCE CORPORATION 发明人 ANDO Kazunori
分类号 H01J37/20 主分类号 H01J37/20
代理机构 代理人
主权项 1. A sample holder which holds a sample such that a surface of the sample is exposed and, can be mounted in each of multiple measurement devices that perform measurement based on different measurement principles respectively so that properties of the sample can be measured by each of the measurement devices, the sample holder comprising: a main body that surrounds the sample; alignment marks that are arranged at each of two or more different positions on a surface of the main body and can be detected by the measurement devices; and a sample-retaining portion that is disposed within the main body and retains the sample such that a height difference between a mark surface of the alignment mark and the surface of the sample is set to a predetermined value.
地址 Tokyo JP