METHOD OF EVALUATING SCRATCH MARK OF MAGNETIC RECORDING MEDIUM AND METHOD OF MANUFACTURING MAGNETIC RECORDING MEDIUM

摘要

According to one embodiment, a method of evaluating a scratch mark includes, for a magnetic recording medium including a magnetic recording layer containing magnetic particles and a metal oxide grain boundary provided between the magnetic particles, detecting and evaluating a scratch mark based on information about the reflection intensity of light in a predetermined wavelength range. The predetermined wavelength range includes at least a second wavelength range from 600 nm to 700 nm and a first wavelength range from 300 nm to 500 nm.

主权项

1. A method of evaluating a scratch mark of a magnetic recording medium, comprising:
applying the magnetic recording medium including a magnetic recording layer containing magnetic particles and a metal oxide grain boundary provided between the magnetic particles to an optical inspection apparatus including a light source configured to emit at least light in a second wavelength range from 600 nm to 700 nm and measuring a second reflection intensity of the light in the second wavelength range; and detecting and evaluating a scratch mark on a surface of the magnetic recording medium based on a measurement result of the second reflection intensity.