发明名称 |
OXIDE SEMICONDUCTOR, TRANSISTOR, AND SEMICONDUCTOR DEVICE |
摘要 |
A novel oxide semiconductor is provided. An oxide semiconductor contains In, an element M (M represents Al, Ga, Y, or Sn), and Zn. The oxide semiconductor has little characteristics variation and structure change and has high electron mobility in the case where the atomic ratio of In to M and Zn in the oxide semiconductor ranges from 4:2:3 to 4:2:4.1 or is a neighborhood thereof. |
申请公布号 |
US2017062620(A1) |
申请公布日期 |
2017.03.02 |
申请号 |
US201615244041 |
申请日期 |
2016.08.23 |
申请人 |
Semiconductor Energy Laboratory Co., Ltd. |
发明人 |
YAMAZAKI Shunpei;TSUBUKU Masashi;OOTA Masashi;SHIMOMURA Akihisa;YAMANE Yasumasa |
分类号 |
H01L29/786;H01L29/06;H01L29/24 |
主分类号 |
H01L29/786 |
代理机构 |
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代理人 |
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主权项 |
1. An oxide semiconductor film comprising In, an element M, and Zn,
wherein the element M represents aluminum, gallium, yttrium, or tin, and wherein an atomic ratio of the In to the element M and the Zn in the oxide semiconductor film is (1+α):(1−α):β (where −1≦α≦1 and β is a positive real number) or a neighborhood thereof. |
地址 |
Atsugi-shi JP |