发明名称 |
THREE-DIMENSIONAL SEMICONDUCTOR MEMORY DEVICES |
摘要 |
Disclosed is a semiconductor memory device including stacks on a substrate, a vertical channel portion connected to the substrate through each of the stacks, and a separation pattern disposed between the stacks. Each of the stacks may include a plurality of gate electrodes stacked on the substrate and insulating patterns interposed between the gate electrodes. Each of the gate electrodes may include a first metal pattern, which is disposed between the insulating patterns to define a recess region recessed toward the vertical channel portion, and a second metal pattern disposed in the recess region. The first and second metal patterns may contain the same metallic material and may have mean grain sizes different from each other. |
申请公布号 |
US2017062472(A1) |
申请公布日期 |
2017.03.02 |
申请号 |
US201615249590 |
申请日期 |
2016.08.29 |
申请人 |
PARK Joyoung;HAN HAUK;LEE SEOK-WON;LEE JEONGGIL;PARK JINWOO;YOON KlHYUN;LIM HYUNSEOK;HA JOOYEON |
发明人 |
PARK Joyoung;HAN HAUK;LEE SEOK-WON;LEE JEONGGIL;PARK JINWOO;YOON KlHYUN;LIM HYUNSEOK;HA JOOYEON |
分类号 |
H01L27/115;H01L21/768;H01L23/532;H01L23/522;H01L23/528 |
主分类号 |
H01L27/115 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor memory device, comprising:
stacks on a substrate, each of the stacks comprising a plurality of gate electrodes stacked on the substrate and insulating patterns interposed between the gate electrodes; a vertical channel connected to the substrate; and a separation pattern disposed between the stacks, wherein each of the gate electrodes comprises: a first metal pattern disposed between the insulating patterns to define a recess region recessed toward the vertical channel; and a second metal pattern disposed in the recess region, and wherein the first and second metal patterns contain the same metallic material and have mean grain sizes different from each other. |
地址 |
Seoul Gyeonggi-do KR |