发明名称 GATE INDUCED DRAIN LEAKAGE REDUCTION
摘要 Exemplary embodiments of the present disclosure are related to reducing, and possibly preventing, gate inducted drain leakage for a switch. A device may comprise an amplifier and at least one transistor coupled in a feedback path of the amplifier. The device may also comprise a circuit configured to modulate a gate of the at least one transistor with a signal comprising a scaled-down and shifted version of a signal at a drain of the at least one transistor.
申请公布号 US2017063306(A1) 申请公布日期 2017.03.02
申请号 US201514939894 申请日期 2015.11.12
申请人 QUALCOMM Incorporated 发明人 Abdelfattah Khaled
分类号 H03F1/02;H03F3/21;H03F3/193 主分类号 H03F1/02
代理机构 代理人
主权项 1. A device, comprising: an amplifier; at least one transistor coupled in a feedback path of the amplifier; and a circuit configured to modulate a gate of the at least one transistor with a signal comprising a scaled-down and shifted version of a signal at a drain of the at least one transistor.
地址 San Diego CA US