发明名称 ATOMIC LAYER CHEMICAL PATTERNS FOR BLOCK COPOLYMER ASSEMBLY
摘要 Provided herein are methods of directed self-assembly (DSA) on atomic layer chemical patterns and related compositions. The atomic layer chemical patterns may be formed from two-dimensional materials such as graphene. The atomic layer chemical patterns provide high resolution, low defect directed self-assembly. For example, DSA on a graphene pattern can be used achieve ten times the resolution of DSA that is achievable on a three-dimensional pattern such as a polymer brush. Assembly of block copolymers on the atomic layer chemical patterns may also facilitate subsequent etch, as the atomic layer chemical patterns are easier to etch than conventional pattern materials.
申请公布号 US2017062229(A1) 申请公布日期 2017.03.02
申请号 US201615215016 申请日期 2016.07.20
申请人 The University of Chicago ;Wisconsin Alumni Research Foundation 发明人 Nealey Paul Franklin;Chang Tzu-Hsuan;Xiong Shisheng;Ma Zhenqiang;Arnold Michael Scott;Jacobberger Robert
分类号 H01L21/308;H01J37/32;C09D153/00;C23C16/455 主分类号 H01L21/308
代理机构 代理人
主权项 1. A composition comprising: a chemical pattern comprising a patterned two-dimensional material; and a microphase-separated block copolymer material overlying the chemical pattern, wherein domains of the microphase-separated block copolymer material are assembled in accordance with the chemical pattern.
地址 Chicago IL US