发明名称 METHOD AND SYSTEM FOR MODELING AN ELECTRONIC DEVICE UNDER TEST (DUT) USING A KERNEL METHOD
摘要 A method provides modeling a DUT and generating a simulated response. The method includes receiving a first portion of a stimulus signal generated by a signal generator, a second portion of the stimulus signal being input to the DUT; receiving a response signal output by the DUT in response to a second portion of the stimulus signal; digitizing the received first portion and the received response signal; correcting the digitized signals; measuring training input series data of the digitized first portion of the stimulus signal and training output series data of the digitized response signal; and utilizing kernel adaptive filtering for extracting a device model from the training input and output series data, and for generating simulated responses of the DUT to subsequent stimulus inputs, respectively. The kernel adaptive filtering may include a kernel least mean squares algorithm, a kernel Affine projection algorithm or a recursive least squares algorithm.
申请公布号 US2017061045(A1) 申请公布日期 2017.03.02
申请号 US201514841165 申请日期 2015.08.31
申请人 Keysight Technologies, Inc. 发明人 Okuyama Sho;Iwai Junichi
分类号 G06F17/50 主分类号 G06F17/50
代理机构 代理人
主权项 1. A method of modeling an electronic device under test (DUT) and generating a simulated response of the electronic DUT, the method comprising: receiving a first portion of the stimulus signal generated by a signal generator, a second portion of the stimulus signal being input to the electronic DUT; receiving a response signal output by the electronic DUT in response to the second portion of the stimulus signal; digitizing the received first portion of the stimulus signal and the received response signal; correcting the digitized first portion of the stimulus signal and the digitized response signal; measuring training input series data of the digitized first portion of the stimulus signal; measuring training output series data of the digitized response signal; and utilizing kernel adaptive filtering (i) for extracting a device model from the training input series data and the training output series data, and (ii) for generating simulated responses of the electronic DUT in response to subsequent stimulus inputs, respectively.
地址 Minneapolis MN US