发明名称 SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SAME
摘要 According to one embodiment, a semiconductor memory device includes: a substrate; a first stacked body; a semiconductor film; a charge storage film; and a second stacked body. The first stacked body includes: a plurality of first insulating layers; and a plurality of electrode layers. The second stacked body includes: a plurality of second insulating layers; a first insulating film provided between the plurality of second insulating layers and including a material different from that of the plurality of first insulating layers, the plurality of second insulating layers, and the plurality of electrode layers; and a second insulating film provided between the first insulating film and the substrate via the plurality of second insulating layers, including a same material as the first insulating film, and having lower film density than the first insulating film.
申请公布号 US2017062455(A1) 申请公布日期 2017.03.02
申请号 US201514923916 申请日期 2015.10.27
申请人 Kabushiki Kaisha Toshiba 发明人 NOMURA Kotaro
分类号 H01L27/115 主分类号 H01L27/115
代理机构 代理人
主权项 1. A semiconductor device comprising: a substrate; a first stacked body provided on the substrate and including: a plurality of first insulating layers separately stacked each other; anda plurality of electrode layers provided between the plurality of first insulating layers; a semiconductor film provided in the first stacked body and extending in stacking direction of the first stacked body; a charge storage film provided between the plurality of electrode layers and the semiconductor film; and a second stacked body provided on the substrate and including: a plurality of second insulating layers separately stacked each other and including a same material as the plurality of first insulating layers;a first insulating film provided between the plurality of second insulating layers, the first insulating film including a material different from that of the plurality of first insulating layers, the plurality of second insulating layers, and the plurality of electrode layers; anda second insulating film provided between the first insulating film and the substrate via the plurality of second insulating layers, the second insulating film including a same material as the first insulating film, the second insulating film having lower film density than the first insulating film.
地址 Minato-ku JP