发明名称 REAL TIME DUAL MODE FULL-FIELD OPTICAL COHERENCE MICROSCOPY WITH FULL RANGE IMAGING
摘要 The invention is a system and method that enable obtaining ultra-high resolution interference, phase and OCT images at high speed. The system uses neither mechanical moving elements nor any optical/electro optical modulating means for obtaining the OCT images. Two OCT operating modes are available: for ultra-high resolution the system allows either spatial coherence TD-FF-OCT or temporal coherence TD-FF-OCT imaging, whereas for high resolution and ultra-high speed the system allows FD-FF-OCT imaging with full range imaging. In the TD mode, the OCT enface images are obtained in real time. In the FD mode, the 2D complex signal is reconstructed in real time. In both cases the method has the advantage of very high speed imaging with great immunity to noise.
申请公布号 US2017059299(A1) 申请公布日期 2017.03.02
申请号 US201515118877 申请日期 2015.02.03
申请人 B. G. NEGEV TECHNOLOGIES AND APPLICATIONS LTD., AT BEN-GURION UNIVERSITY 发明人 SAFRANI Avner;ABDULHALIM Ibrahim
分类号 G01B9/02;G02B21/00;G02B21/26;G02B21/22 主分类号 G01B9/02
代理机构 代理人
主权项 1. An interference microscopy 3D imaging system comprising: a. an illumination unit 1700, which provides light to the system; b. a frequency domain triggering unit 1800, which accepts a small portion of the light from illumination unit 1700 and allows triggering of detectors in a frequency domain operating mode; c. a two beam orthogonally polarized interferometer, which is illuminated by light from illumination unit 1900 and; d. a detection unit comprising: i. a tube lens;ii. at least three 50/50 non-polarizing beam splitters;iii. at least two analyzers;iv. at least two parallel detectors; andv. at least one precision achromatic wave plate chosen from at least one of the following types of wave plates: compensating, half wave, and quarter wave; and e. a motorized stage on which the sample is mounted, the motorized stage connected to and controlled by a processing unit; wherein the interference microscopy 3D imaging system allows at least two full field achromatic phase shifted interference signals to be captured simultaneously and processed to yield an amplitude signal and a phase signal thereby allowing ultra-high speed, accurate 3D imaging with great immunity to vibrational and intensity noise.
地址 Beer Sheva IL