发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
摘要 According to one embodiment, a semiconductor device includes an element isolation insulating film, a gate electrode film, source/drain regions, a channel region, and an air gap. The element isolation insulating film partitions an element arrangement area on one main face side of a semiconductor substrate. The channel region is disposed near a surface of the semiconductor substrate below the gate electrode film. The air gap is disposed at a region of the element isolation insulating film contacting with the channel region.
申请公布号 US2017062423(A1) 申请公布日期 2017.03.02
申请号 US201614986952 申请日期 2016.01.04
申请人 Kabushiki Kaisha Toshiba 发明人 OKANO Kimitoshi
分类号 H01L27/092;H01L21/764;H01L21/8238;H01L21/762;H01L29/78;H01L29/06 主分类号 H01L27/092
代理机构 代理人
主权项 1. A semiconductor device comprising: an element isolation insulating film having a first depth and partitioning an element arrangement area on one main face side of a semiconductor substrate; a gate electrode film disposed above the semiconductor substrate within the element arrangement area, through a gate insulating film, and extending in a first direction; source/drain regions containing a first impurity of a predetermined conductivity type diffused therein, the source/drain regions being disposed near a surface of the semiconductor substrate on both sides of the gate electrode film in a second direction perpendicular to the first direction; a channel region containing a second impurity of a predetermined conductivity type diffused therein, the channel region being disposed near a surface of the semiconductor substrate below the gate electrode film; and an air gap disposed at a region of the element isolation insulating film contacting with the channel region.
地址 Minato-ku JP