发明名称 CHAMFERLESS VIA STRUCTURES
摘要 Chamferless via structures and methods of manufacture are provided. The method includes: forming at least one self-aligned via within at least dielectric material; plugging the at least one self-aligned via with material; forming a protective sacrificial mask over the material which plugs the at least one self-aligned via, after a recessing process; forming at least one trench within the dielectric material, with the protective sacrificial mask protecting the material during the trench formation; removing the protective sacrificial mask and the material within the at least one self-aligned via to form a wiring via; and filling the wiring via and the at least one trench with conductive material.
申请公布号 US2017062331(A1) 申请公布日期 2017.03.02
申请号 US201615333874 申请日期 2016.10.25
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 LENHARDT Mark L.;MONT Frank W.;PEETHALA Brown C.;SIDDIQUI Shariq;STRISS Jessica P.;TRICKETT Douglas M.
分类号 H01L23/522;H01L23/528 主分类号 H01L23/522
代理机构 代理人
主权项 1. A structure, comprising a conductive line and via formed in a low-k dielectric material wherein the via is chamferless and the low-k dielectric material is continuous with no etch stop layer at a line/via junction.
地址 Armonk NY US