发明名称 |
CHAMFERLESS VIA STRUCTURES |
摘要 |
Chamferless via structures and methods of manufacture are provided. The method includes: forming at least one self-aligned via within at least dielectric material; plugging the at least one self-aligned via with material; forming a protective sacrificial mask over the material which plugs the at least one self-aligned via, after a recessing process; forming at least one trench within the dielectric material, with the protective sacrificial mask protecting the material during the trench formation; removing the protective sacrificial mask and the material within the at least one self-aligned via to form a wiring via; and filling the wiring via and the at least one trench with conductive material. |
申请公布号 |
US2017062331(A1) |
申请公布日期 |
2017.03.02 |
申请号 |
US201615333874 |
申请日期 |
2016.10.25 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
LENHARDT Mark L.;MONT Frank W.;PEETHALA Brown C.;SIDDIQUI Shariq;STRISS Jessica P.;TRICKETT Douglas M. |
分类号 |
H01L23/522;H01L23/528 |
主分类号 |
H01L23/522 |
代理机构 |
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代理人 |
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主权项 |
1. A structure, comprising a conductive line and via formed in a low-k dielectric material wherein the via is chamferless and the low-k dielectric material is continuous with no etch stop layer at a line/via junction. |
地址 |
Armonk NY US |