发明名称 設計記述間差分解析装置、設計記述間差分解析プログラムおよび設計記述間差分解析方法
摘要 PROBLEM TO BE SOLVED: To provide an inter-design description difference analysis device, an inter-design description difference analysis program and an inter-design description difference analysis method capable of analyzing the minimum difference between a first instruction string and a second instruction string.SOLUTION: In an inter-design description difference analysis device 1, under a constraint (constraint of instruction coincidence) that when names N, Nare coincident, and operands O, Oin an instruction are coincident, the instructions p, q are coincident, a constraint (constraint of uniqueness guarantee of coincidence) that one instruction p of an intermediate instruction string is coincident with one instruction q of a post-ECO intermediate instruction string and a constraint (constraint of sequence violation) that the instruction q of the post-ECO intermediate instruction string complies with the sequence of the instruction p of the intermediate instruction string, a correspondence relationship between the instructions p, q is specified such that the number of instruction sets in which internal expressions are coincident among the combination of the instructions p, q becomes the maximum. The correspondence relationship specified by applying the above mentioned method is applied to a normalized instruction string 14a and a post-ECO normalized instruction string 14b such that the minimum difference between an intermediate instruction string 15a and a post-ECO intermediate instruction string 15b can be analyzed.
申请公布号 JP6086420(B2) 申请公布日期 2017.03.01
申请号 JP20120184662 申请日期 2012.08.23
申请人 国立大学法人 東京大学 发明人 吉田 浩章;藤田 昌宏
分类号 G06F17/50 主分类号 G06F17/50
代理机构 代理人
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