| 摘要 |
The aim of the invention is to make the entire device more compact by irradiating a sample with incoming light perpendicularly, while at the same time to measure the degree of anisotropy and the orientation of the optical axis and over an extremely short period of time. An optical system (4) is formed, in which incoming light from a laser (6) is made incident upon a sample (3) in a perpendicular direction, and reflected light reflected in a perpendicular direction is directed to a photoreceptor (9) via a half-mirror (7), a polarizer (P) is positioned between a laser (6) and the half-mirror (7), an analyzer (A) is positioned between the half-mirror (7) and the photoreceptor element (9), and a 1/2 wavelength plate (12) that rotates the linearly polarized light generated by the polarizer (P), and a 1/4 wavelength plate (13); that cyclically rotates the direction of the delay phase axis in such a manner that the angle of rotation with respect to the 1/2 wavelength plate (12) from the initial position staggered by +/-delta (delta is not equal to n[pi]/4, where n is an integer) with respect to the delay phase axis of the 1/2 wavelength plate (12) is doubled, are positioned between the half mirror (7) and the sample (3). |
