发明名称 半導体装置
摘要 It is an object to provide an oxide semiconductor which is suitable for use in a semiconductor device. Alternatively, it is another object to provide a semiconductor device using the oxide semiconductor. Provided is a semiconductor device including an In—Ga—Zn—O based oxide semiconductor layer in a channel formation region of a transistor. In the semiconductor device, the In—Ga—Zn—O based oxide semiconductor layer has a structure in which crystal grains represented by InGaO3(ZnO)m (m=1) are included in an amorphous structure represented by InGaO3(ZnO)m (m>0).
申请公布号 JP6088599(B2) 申请公布日期 2017.03.01
申请号 JP20150150837 申请日期 2015.07.30
申请人 株式会社半導体エネルギー研究所 发明人 秋元 健吾;坂田 淳一郎;廣橋 拓也;高橋 正弘;岸田 英幸;宮永 昭治
分类号 H01L29/786 主分类号 H01L29/786
代理机构 代理人
主权项
地址