发明名称 |
Metal oxide semiconductor field effect transistor having asymmetric lightly doped drain regions |
摘要 |
A metal-oxide-semiconductor field effect transistor (MOSFET) includes a substrate and a gate structure over a top surface of the substrate. The MOSFET further includes a source in the substrate on a first side of the gate structure and a drain in the substrate on a second side of the gate structure opposite the first side. A surface portion of the substrate extending from the source to the drain has an asymmetric dopant concentration profile. |
申请公布号 |
US9583618(B2) |
申请公布日期 |
2017.02.28 |
申请号 |
US201313928971 |
申请日期 |
2013.06.27 |
申请人 |
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. |
发明人 |
Cheng Chih-Chang;Chu Fu-Yu;Liu Ruey-Hsin |
分类号 |
H01L29/78;H01L29/66;H01L27/06;H01L21/8234;H01L21/265;H01L29/10 |
主分类号 |
H01L29/78 |
代理机构 |
Hauptman Ham, LLP |
代理人 |
Hauptman Ham, LLP |
主权项 |
1. A metal-oxide-semiconductor field effect transistor (MOSFET) comprising:
a substrate; a gate structure over a top surface of the substrate, wherein the gate structure has a gate dielectric layer over the top surface of the substrate; a source in the substrate on a first side of the gate structure, wherein a first dopant concentration is between the source and a region under the gate dielectric layer, and a depth of the first dopant concentration is shallower than a depth of the source; a drain in the substrate on a second side of the gate structure opposite the first side, wherein a second dopant concentration is between the drain and the region under the gate dielectric layer, and the second dopant concentration is less than the first dopant concentration; and a deep well in the substrate extending under the source, the gate structure and the drain. |
地址 |
TW |