发明名称 Metal oxide semiconductor field effect transistor having asymmetric lightly doped drain regions
摘要 A metal-oxide-semiconductor field effect transistor (MOSFET) includes a substrate and a gate structure over a top surface of the substrate. The MOSFET further includes a source in the substrate on a first side of the gate structure and a drain in the substrate on a second side of the gate structure opposite the first side. A surface portion of the substrate extending from the source to the drain has an asymmetric dopant concentration profile.
申请公布号 US9583618(B2) 申请公布日期 2017.02.28
申请号 US201313928971 申请日期 2013.06.27
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 Cheng Chih-Chang;Chu Fu-Yu;Liu Ruey-Hsin
分类号 H01L29/78;H01L29/66;H01L27/06;H01L21/8234;H01L21/265;H01L29/10 主分类号 H01L29/78
代理机构 Hauptman Ham, LLP 代理人 Hauptman Ham, LLP
主权项 1. A metal-oxide-semiconductor field effect transistor (MOSFET) comprising: a substrate; a gate structure over a top surface of the substrate, wherein the gate structure has a gate dielectric layer over the top surface of the substrate; a source in the substrate on a first side of the gate structure, wherein a first dopant concentration is between the source and a region under the gate dielectric layer, and a depth of the first dopant concentration is shallower than a depth of the source; a drain in the substrate on a second side of the gate structure opposite the first side, wherein a second dopant concentration is between the drain and the region under the gate dielectric layer, and the second dopant concentration is less than the first dopant concentration; and a deep well in the substrate extending under the source, the gate structure and the drain.
地址 TW
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