发明名称 Three-dimensional semiconductor device and method of manufacturing the same
摘要 A three-dimensional semiconductor device is provided, comprising: a plurality of ground selection line (GSL) sections separately formed on a substrate, the GSL sections being electrically insulated from each other and extended in parallel to each other, and the GSL sections extending along a first direction; a plurality of stacked structures vertically formed on the GSL sections on the substrate, and each stacked structure comprising alternated semiconductor layers and insulating layers; string selection lines (SSLs) separately formed on the stacked structures, and the string selection lines extending along the first direction; and bit lines disposed above the SSLs and extending along a second direction, the bit lines arranged parallel to each other and in perpendicular to the SSLs and GSL sections, wherein a plurality of memory cells of memory layers respectively defined by the stacked structures, the SSLs, the GSL sections and the bit lines correspondingly.
申请公布号 US9583503(B1) 申请公布日期 2017.02.28
申请号 US201514966173 申请日期 2015.12.11
申请人 MACRONIX INTERNATIONAL CO., LTD. 发明人 Lee Guan-Ru
分类号 H01L27/115;H01L23/528;H01L21/3205;H01L21/768;H01L27/06;H01L21/822 主分类号 H01L27/115
代理机构 McClure, Qualey & Rodack, LLP 代理人 McClure, Qualey & Rodack, LLP
主权项 1. A three-dimensional (3D) semiconductor device, comprising: a plurality of ground selection line (GSL) sections separately formed on a substrate, the GSL sections being electrically insulated from each other and extended in parallel to each other, and the GSL sections extending along a first direction, wherein the GSL sections comprise a plurality of odd-numbered GSL sections forming a finger structure and a plurality of even-numbered GSL sections forming a finger structure, and the odd-numbered GSL sections are interlaced with the even-numbered GSL sections; a plurality of stacked structures vertically formed on the GSL sections, and each stacked structure comprising alternated semiconductor layers and insulating layers; a plurality of string selection lines (SSLs) separately formed on the stacked structures, and the string selection lines extending along the first direction; and a plurality of bit lines disposed above the SSLs and extending along a second direction, the bit lines arranged parallel to each other and in perpendicular to the SSLs and GSL sections, wherein a plurality of memory cells of memory layers are respectively defined by the stacked structures, the SSLs, the GSL sections and the bit lines correspondingly, and a plurality of memory pages respectively correspond to the memory cells associated with one of the GSL sections.
地址 Hsinchu TW