发明名称 Manufacturing method of a semiconductor device and method for creating a layout thereof
摘要 A method for manufacturing a semiconductor device of one embodiment of the present invention includes: forming an insulation layer to be processed over a substrate; forming a first sacrificial layer in a first area over the substrate, the first sacrificial layer being patterned to form in the first area a functioning wiring connected to an element; forming a second sacrificial layer in a second area over the substrate, the second sacrificial layer being patterned to form in the second area a dummy wiring; forming a third sacrificial layer at a side wall of the first sacrificial layer and forming a fourth sacrificial layer at a side wall of the second sacrificial layer, the third sacrificial layer and the fourth sacrificial layer being separated; forming a concavity by etching the insulation layer to be processed using the third sacrificial layer and the fourth sacrificial layer as a mask; and filling a conductive material in the concavity.
申请公布号 US9583437(B2) 申请公布日期 2017.02.28
申请号 US201514829250 申请日期 2015.08.18
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 Yanagidaira Kosuke;Kodama Chikaaki
分类号 H01L23/528;H01L21/768;H01L21/311;H01L23/522;H01L27/02;H01L27/115;H01L23/48 主分类号 H01L23/528
代理机构 Oblon, McClelland, Maier & Neustadt, L.L.P. 代理人 Oblon, McClelland, Maier & Neustadt, L.L.P.
主权项 1. A semiconductor device comprising: two adjacent functioning wirings including a first functioning wiring and a second functioning wiring; a first electrically isolated torus-like conductor pattern area between the two adjacent functioning wirings; and a first insulating film; wherein the first electrically isolated torus-like conductor pattern area surrounds the first insulating film.
地址 Minato-ku JP