发明名称 Forming fence conductors using spacer etched trenches
摘要 A spacer etching process produces ultra-narrow conductive lines in a plurality of semiconductor dice. Trenches are formed in a first dielectric then a sacrificial film is deposited onto the first dielectric and the trench surfaces formed therein. Planar sacrificial film is removed from the face of the first dielectric and bottom of the trenches, leaving only sacrificial films on the trench walls. A gap between the sacrificial films on the trench walls is filled in with a second dielectric. A portion of the second dielectric is removed to expose tops of the sacrificial films. The sacrificial films are removed leaving ultra-thin gaps that are filled in with a conductive material. The tops of the conductive material in the gaps are exposed to create “fence conductors.” Portions of the fence conductors and surrounding insulating materials are removed at appropriate locations to produce desired conductor patterns comprising isolated fence conductors.
申请公布号 US9583435(B2) 申请公布日期 2017.02.28
申请号 US201514714475 申请日期 2015.05.18
申请人 MICROCHIP TECHNOLOGY INCORPORATED 发明人 Fest Paul
分类号 H01L23/58;H01L21/768;H01L23/528 主分类号 H01L23/58
代理机构 Slayden Grubert Beard PLLC 代理人 Slayden Grubert Beard PLLC
主权项 1. A method for forming fence conductors in a semiconductor integrated circuit die, said method comprising the steps of: depositing a first dielectric on a face of a semiconductor substrate; creating at least one trench in the first dielectric; depositing a sacrificial film on the first dielectric including walls and a bottom of the at least one trench; removing portions of the sacrificial film from a face of the first dielectric and the bottom of the at least one trench, wherein only sacrificial films remain on the walls of the at least one trench; depositing a second dielectric between the sacrificial films on the walls of the at least one trench; removing the first and second dielectrics until top portions of the sacrificial film are exposed between the first and second dielectrics; removing the sacrificial films between the first and second dielectrics leaving at least two narrow channels therein; depositing conductive material on faces of the first and second dielectrics and into the at least two narrow channels; removing portions of the conductive material on the faces of the first and second dielectrics until only tops of the conductive material are exposed in the at least two narrow channels: and depositing a barrier layer in one of the at least two narrow channels before the step of depositing the conductive material therein.
地址 Chandler AZ US