发明名称 |
Semipolar nitride semiconductor structure and method of manufacturing the same |
摘要 |
Provided are a semipolar nitride semiconductor structure and a method of manufacturing the same. The semipolar nitride semiconductor structure includes a silicon substrate having an Si(11k) surface satisfying 7≦k≦13; and a nitride semiconductor layer formed on the silicon substrate. The nitride semiconductor layer has a semipolar characteristic in which a polarization field is approximately 0. |
申请公布号 |
US9583340(B2) |
申请公布日期 |
2017.02.28 |
申请号 |
US201414532921 |
申请日期 |
2014.11.04 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
Kim Jun-Youn;Kim Jae-Kyun;Kim Joo-Sung;Park Young-Soo;Tak Young-Jo |
分类号 |
C30B29/40;H01L21/02;C30B25/18;H01L33/12;H01L33/00 |
主分类号 |
C30B29/40 |
代理机构 |
Muir Patent Law, PLLC |
代理人 |
Muir Patent Law, PLLC |
主权项 |
1. A method of manufacturing a semipolar nitride structure, the method comprising:
preparing a silicon substrate having a Si(11k) surface satisfying 7≦k≦13; performing anisotropic etching on the Si(11k) surface of the prepared silicon substrate so that, at least at a first region of the Si(11k) surface of the silicon substrate, a Si(111) facet is exposed by a larger amount than a Si(100) facet; and growing a nitride semiconductor layer on the first region of the silicon substrate, wherein the nitride semiconductor layer has a semipolar characteristic in which a polarization field is approximately 0. |
地址 |
Samsung-ro, Yeongtong-gu, Suwon-si, Gyeonggi-do KR |