发明名称 Semipolar nitride semiconductor structure and method of manufacturing the same
摘要 Provided are a semipolar nitride semiconductor structure and a method of manufacturing the same. The semipolar nitride semiconductor structure includes a silicon substrate having an Si(11k) surface satisfying 7≦k≦13; and a nitride semiconductor layer formed on the silicon substrate. The nitride semiconductor layer has a semipolar characteristic in which a polarization field is approximately 0.
申请公布号 US9583340(B2) 申请公布日期 2017.02.28
申请号 US201414532921 申请日期 2014.11.04
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 Kim Jun-Youn;Kim Jae-Kyun;Kim Joo-Sung;Park Young-Soo;Tak Young-Jo
分类号 C30B29/40;H01L21/02;C30B25/18;H01L33/12;H01L33/00 主分类号 C30B29/40
代理机构 Muir Patent Law, PLLC 代理人 Muir Patent Law, PLLC
主权项 1. A method of manufacturing a semipolar nitride structure, the method comprising: preparing a silicon substrate having a Si(11k) surface satisfying 7≦k≦13; performing anisotropic etching on the Si(11k) surface of the prepared silicon substrate so that, at least at a first region of the Si(11k) surface of the silicon substrate, a Si(111) facet is exposed by a larger amount than a Si(100) facet; and growing a nitride semiconductor layer on the first region of the silicon substrate, wherein the nitride semiconductor layer has a semipolar characteristic in which a polarization field is approximately 0.
地址 Samsung-ro, Yeongtong-gu, Suwon-si, Gyeonggi-do KR