发明名称 |
Gate stack with tunable work function |
摘要 |
A method for fabricating a gate stack of a semiconductor device comprising forming a first dielectric layer over a channel region of the device, forming a barrier layer over the first dielectric layer, forming a first gate metal layer over the barrier layer, forming a capping layer over the first gate metal layer, removing portions of the barrier layer, the first gate metal layer, and the capping layer to expose a portion of the first dielectric layer in a p-type field effect transistor (pFET) region of the gate stack, depositing a first nitride layer on exposed portions of the capping layer and the first dielectric layer, depositing a scavenging layer on the first nitride layer, depositing a second nitride layer on the scavenging layer, and depositing a gate electrode material on the second nitride layer. |
申请公布号 |
US9583400(B1) |
申请公布日期 |
2017.02.28 |
申请号 |
US201614996563 |
申请日期 |
2016.01.15 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
Bao Ruqiang;Krishnan Siddarth A.;Kwon Unoh;Narayanan Vijay |
分类号 |
H01L21/3205;H01L21/4763;H01L21/8238;H01L21/28;H01L29/66;H01L29/49;H01L27/092 |
主分类号 |
H01L21/3205 |
代理机构 |
Cantor Colburn LLP |
代理人 |
Cantor Colburn LLP |
主权项 |
1. A method for fabricating a gate stack of a semiconductor device, the method comprising:
forming a first dielectric layer over a channel region of the device; forming a barrier layer over the first dielectric layer; forming a first gate metal layer over the barrier layer; forming a capping layer over the first gate metal layer; removing portions of the barrier layer, the first gate metal layer, and the capping layer to expose a portion of the first dielectric layer in a p-type field effect transistor (pFET) region of the gate stack; depositing a first nitride layer on exposed portions of the capping layer and the first dielectric layer; depositing a scavenging layer on the first nitride layer; depositing a second nitride layer on the scavenging layer; and depositing a gate electrode material on the second nitride layer. |
地址 |
Armonk NY US |