发明名称 Interlevel conductor pre-fill utilizing selective barrier deposition
摘要 A substrate is provided having a dual damascene structure formed within a dielectric material over the substrate. The dual damascene structure includes a trench and an opening formed to extend from a bottom of the trench to an underlying conductive material, with the underlying conductive material exposed at a bottom of the opening. The dual damascene structure is exposed to a sealing process by which the exposed surfaces of the dielectric material in the opening are sealed without covering the underlying conductive material exposed at the bottom of the opening. The sealing process can be one or more of deposition of a flowable film, deposition of an amorphous carbon barrier layer, and formation of a self-assembled monolayer of an amino group. After the sealing process, an electroless deposition process is performed to fill the opening with a metallic material in a bottom-to-top manner up to the bottom of the trench.
申请公布号 US9583386(B2) 申请公布日期 2017.02.28
申请号 US201514874307 申请日期 2015.10.02
申请人 Lam Research Corporation 发明人 Kolics Artur;Lee William T.;Zhao Larry;Wong Derek;Nalla Praveen;Ashtiani Kaihan;Van Cleemput Patrick A.;Dordi Yezdi
分类号 H01L21/768;H01L23/532;C23C16/26 主分类号 H01L21/768
代理机构 Martine Penilla Group, LLP 代理人 Martine Penilla Group, LLP
主权项 1. A method for manufacturing a semiconductor device, comprising: providing a substrate having at least one dual damascene structure formed within a dielectric material over the substrate, the at least one dual damascene structure including a trench and an opening formed to extend from a bottom of the trench to an underlying conductive material such that the underlying conductive material is exposed at a bottom of the opening; forming an amorphous carbon barrier layer on each sidewall of the opening without covering the underlying conductive material exposed at the bottom of the opening; performing a cleaning process on the substrate, with structures formed thereon, to remove material residues left over from formation of the amorphous carbon barrier layer; and performing an electroless deposition process to fill the opening with a metallic material in a bottom-to-top manner up to the bottom of the trench, wherein the electroless deposition process initiates on the underlying conductive material exposed at the bottom of the opening.
地址 Fremont CA US