发明名称 APPARATUS FOR INSPECTING ROBOT HANDS
摘要 An inspection apparatus includes a supporting substrate. A first sensor unit is provided on the supporting substrate, the first sensor unit comprising a first light-emitting device and a first light-receiving device which are spaced apart from each other and face each other. A second sensor unit is provided on the supporting substrate, the second sensor unit comprising a second light-emitting device and a second light-receiving device which are spaced apart from each other and face each other. The first and second light-emitting devices and the first and second light-receiving devices are disposed at a same distance from a top surface of the supporting substrate. The first and second sensor units are configured to detect whether a robot hand moves in a first direction perpendicular to the top surface of the supporting substrate.
申请公布号 US2017052019(A1) 申请公布日期 2017.02.23
申请号 US201615228390 申请日期 2016.08.04
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 WON JUNGMIN;JUNG MYOUNGHO;LEE SANG-HO;SONG DONGYUN;YUN SUNGKYUNG
分类号 G01B11/14;G01V8/14;B25J11/00;G01B11/26 主分类号 G01B11/14
代理机构 代理人
主权项 1. An inspection apparatus, comprising: a supporting substrate; a first sensor unit provided on the supporting substrate, the first sensor unit comprising a first light-emitting device and a first light-receiving device which are spaced apart from each other and face each other; and a second sensor unit provided on the supporting substrate, the second sensor unit comprising a second light-emitting device and a second light-receiving device which are spaced apart from each other and face each other, wherein the first and second light-emitting devices and the first and second light-receiving devices are disposed at a same distance from a top surface of the supporting substrate, and the first and second sensor units are configured to detect whether a robot hand moves in a first direction perpendicular to the top surface of the supporting substrate.
地址 SUWON-SI KR