| 发明名称 |
SEMICONDUCTOR DEVICE AND SEMICONDUCTOR SYSTEM |
| 摘要 |
A semiconductor system may include a first semiconductor device configured to output a test stop signal and a calibration control signal. The semiconductor system may include a second semiconductor device configured to generate a first state code from an external resistor, a second state code from an internal resistor, and a third state code from a fuse array in response to the calibration control signal, and to select one of the first to third state codes as a selection code in response to the test stop signal and the calibration control signal. |
| 申请公布号 |
US2017054442(A1) |
申请公布日期 |
2017.02.23 |
| 申请号 |
US201514926941 |
申请日期 |
2015.10.29 |
| 申请人 |
SK hynix Inc. |
发明人 |
KIM Jae Il |
| 分类号 |
H03K19/00 |
主分类号 |
H03K19/00 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A semiconductor system comprising:
a first semiconductor device configured to output a test stop signal and a calibration control signal; and a second semiconductor device configured to generate a first state code from an external resistor, a second state code from an internal resistor, and a third state code from a fuse array in response to the calibration control signal, and to select one of the first to third state codes as a selection code in response to the test stop signal and the calibration control signal. |
| 地址 |
Icheon-si Gyeonggi-do KR |
