发明名称 DOUBLE-SIDE PROCESS SILICON MOS AND PASSIVE DEVICES FOR RF FRONT-END MODULES
摘要 An integrated circuit includes a first semiconductor substrate having a first surface and a second surface opposite to the first surface, at least one first trench extending into the first semiconductor substrate from the first surface and having a first depth, at least one second trench extending into the first semiconductor substrate from the first surface and having a second depth greater than the first depth, a thinned semiconductor region with a first recessed region extending in the first semiconductor substrate from the second surface and having a first thickness, a second recessed region in the first semiconductor substrate extending from the second surface to the first surface, and a bulk dielectric layer covering the second surface of the first semiconductor substrate.
申请公布号 US2017053907(A1) 申请公布日期 2017.02.23
申请号 US201615345135 申请日期 2016.11.07
申请人 SEMICONDUCTOR MANUFACTURING INTERNATIONAL (SHANGHAI) CORPORATION 发明人 HUANG HERB HE;DROWLEY CLIFF
分类号 H01L27/06;H01L27/12;H01L23/48;H01L49/02;H01L21/768;H01L23/528;H01L23/522;H01L21/762;H01L21/84;H01L29/66;H01L29/78;B81B7/00 主分类号 H01L27/06
代理机构 代理人
主权项 1. An integrated circuit, comprising: a first semiconductor substrate having a first surface and a second surface that is opposite to the first surface; one or more first trenches extending into the first semiconductor substrate from the first surface, the first trenches being characterized by a first depth; one or more second trenches extending into the first semiconductor substrate from the first surface, the second trenches being characterized by a second depth greater than the first depth; a thinned semiconductor region with a first recessed region extending in the first semiconductor substrate from the second surface, the thinned semiconductor region being characterized by a first thickness; a second recessed region in the first semiconductor substrate extending from the second surface to the first surface; and a bulk dielectric layer covering the second surface of the first semiconductor substrate.
地址 Shanghai CN