发明名称 |
DOUBLE-SIDE PROCESS SILICON MOS AND PASSIVE DEVICES FOR RF FRONT-END MODULES |
摘要 |
An integrated circuit includes a first semiconductor substrate having a first surface and a second surface opposite to the first surface, at least one first trench extending into the first semiconductor substrate from the first surface and having a first depth, at least one second trench extending into the first semiconductor substrate from the first surface and having a second depth greater than the first depth, a thinned semiconductor region with a first recessed region extending in the first semiconductor substrate from the second surface and having a first thickness, a second recessed region in the first semiconductor substrate extending from the second surface to the first surface, and a bulk dielectric layer covering the second surface of the first semiconductor substrate. |
申请公布号 |
US2017053907(A1) |
申请公布日期 |
2017.02.23 |
申请号 |
US201615345135 |
申请日期 |
2016.11.07 |
申请人 |
SEMICONDUCTOR MANUFACTURING INTERNATIONAL (SHANGHAI) CORPORATION |
发明人 |
HUANG HERB HE;DROWLEY CLIFF |
分类号 |
H01L27/06;H01L27/12;H01L23/48;H01L49/02;H01L21/768;H01L23/528;H01L23/522;H01L21/762;H01L21/84;H01L29/66;H01L29/78;B81B7/00 |
主分类号 |
H01L27/06 |
代理机构 |
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代理人 |
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主权项 |
1. An integrated circuit, comprising:
a first semiconductor substrate having a first surface and a second surface that is opposite to the first surface; one or more first trenches extending into the first semiconductor substrate from the first surface, the first trenches being characterized by a first depth; one or more second trenches extending into the first semiconductor substrate from the first surface, the second trenches being characterized by a second depth greater than the first depth; a thinned semiconductor region with a first recessed region extending in the first semiconductor substrate from the second surface, the thinned semiconductor region being characterized by a first thickness; a second recessed region in the first semiconductor substrate extending from the second surface to the first surface; and a bulk dielectric layer covering the second surface of the first semiconductor substrate. |
地址 |
Shanghai CN |