| 发明名称 |
METHODS AND APPARATUS TO MEASURE AND ANALYZE VIBRATION SIGNATURES |
| 摘要 |
Methods and apparatus to measure and analyze vibration signatures are disclosed. In some examples, a meter is provided comprising a waveform generator to generate a waveform based on first distance measurements of an object. In some examples, the meter includes a waveform generator to determine a first vibration characteristic of the object based on the waveform. In some examples, the meter includes a comparator to compare the first vibration characteristic to a signature vibration characteristic of the object, the signature vibration characteristic of the object indicative of normal characteristics of the object. In some examples, the meter includes a reporter to, in response to determining the first vibration characteristic does not match the signature vibration characteristic, generate an alert. |
| 申请公布号 |
US2017052148(A1) |
申请公布日期 |
2017.02.23 |
| 申请号 |
US201514941189 |
申请日期 |
2015.11.13 |
| 申请人 |
Texas Instruments Incorporated |
发明人 |
Estevez Leonardo William;Zhu Yuming;Patole Sujeet Milind |
| 分类号 |
G01N29/12;G01N29/07 |
主分类号 |
G01N29/12 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A meter, comprising:
a waveform generator to generate a waveform based on first distance measurements of an object; a waveform analyzer to determine a first vibration characteristic of the object based on the waveform; a comparator to compare the first vibration characteristic to a signature vibration characteristic of the object, the signature vibration characteristic of the object indicative of normal characteristics of the object; and a reporter to, in response to determining the first vibration characteristic does not match the signature vibration characteristic, generate an alert. |
| 地址 |
Dallas TX US |
