发明名称 SEMICONDUCTOR DEVICE
摘要 It is aimed to reduce a current concentration at the edge of the contact electrode.;Provided is a semiconductor device including a semiconductor layer, a first trench electrode formed in the semiconductor layer on a front surface side thereof, and a second trench electrode formed in the semiconductor layer on the front surface side thereof so as to oppose the first trench electrode. Here, the first trench electrode is formed in a mesh-like pattern. The semiconductor layer may further include a first-conductivity-type region and a second-conductivity-type region having a different conductivity type than the first-conductivity-type region. The first trench electrode may be electrically connected to the first-conductivity-type region, and the second trench electrode may be electrically connected to the second-conductivity-type region.
申请公布号 US2017053991(A1) 申请公布日期 2017.02.23
申请号 US201615182603 申请日期 2016.06.15
申请人 FUJI ELECTRIC CO., LTD. 发明人 YAO Noriaki
分类号 H01L29/417;H01L29/739;H01L29/04 主分类号 H01L29/417
代理机构 代理人
主权项 1. A semiconductor device comprising: a semiconductor layer; a first trench electrode formed in the semiconductor layer on a front surface side thereof; and a second trench electrode formed in the semiconductor layer on the front surface side thereof, the second trench electrode opposing the first trench electrode, wherein the first trench electrode is formed in a mesh-like pattern.
地址 Kanagawa JP