发明名称 NONVOLATILE SEMICONDUCTOR MEMORY DEVICE
摘要 A nonvolatile semiconductor memory device includes a control circuit configured to control a soft program operation of setting nonvolatile memory cells to a first threshold voltage distribution state of the nonvolatile memory cells. When a characteristic of the nonvolatile memory cells is in a first state, the control circuit executes the soft program operation by applying a first voltage for setting the nonvolatile memory cells to the first threshold voltage distribution state to first word lines, and applying a second voltage higher than the first voltage to a second word line. When the characteristic of the nonvolatile memory cells is in a second state, the control circuit executes the soft program operation by applying a third voltage equal to or lower than the first voltage to the first word lines and applying a fourth voltage lower than the second voltage to the second word line.
申请公布号 US2017053700(A1) 申请公布日期 2017.02.23
申请号 US201615345585 申请日期 2016.11.08
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 SHIINO Yasuhiro;TAKAHASHI Eietsu
分类号 G11C16/04;G11C16/34;G11C16/16;G11C16/28;G11C16/08 主分类号 G11C16/04
代理机构 代理人
主权项 1. (canceled)
地址 Minato-ku JP