发明名称 PROJECTION EXPOSURE APPARATUS WITH NEAR-FIELD MANIPULATOR
摘要 A semiconductor lithography projection exposure apparatus includes a projection lens which includes a manipulator. The manipulator includes an optical element; a base frame; a sensor frame arranged on the base frame; and a sensor arranged on the sensor frame. The manipulator is configured to correct wavefront aberrations of used optical radiation that pass through the optical element during the operation of the projection lens. The manipulator is arranged directly after an object plane of the apparatus along a path of the used optical radiation. The sensor is configured to measure a deformation or a deflection of the optical element. A coefficient of thermal expansion of the sensor frame is within 16 ppm/K of a coefficient of thermal expansion of the base frame.
申请公布号 US2017052453(A1) 申请公布日期 2017.02.23
申请号 US201615345460 申请日期 2016.11.07
申请人 Carl Zeiss SMT GmbH 发明人 Deufel Peter;Lippert Johannes;Marsollek Pascal;Wesselingh Jasper;Kwan Yim-Bun Patrick
分类号 G03F7/20 主分类号 G03F7/20
代理机构 代理人
主权项 1. An apparatus, comprising: a projection lens comprising a manipulator, the manipulator comprising: an optical element;a base frame;a sensor frame arranged on the base frame; anda sensor arranged on the sensor frame, wherein: the manipulator is configured to correct wavefront aberrations of used optical radiation that pass through the optical element during the operation of the projection lens;the manipulator is arranged directly after an object plane of the apparatus along a path of the used optical radiation;the sensor is configured to measure a deformation or a deflection of the optical element;a coefficient of thermal expansion of the sensor frame is within 16 ppm/K of a coefficient of thermal expansion of the base frame; and wherein the apparatus is a semiconductor lithography projection exposure apparatus.
地址 Oberkochen DE