发明名称 HIGHLY REFLECTIVE SURFACE PROFILE MEASUREMENT SYSTEM WITH LIQUID ATOMIZATION AND THE METHOD THEREOF
摘要 A highly reflective surface profile measurement system with liquid atomization and a method thereof are both provided. The method includes the following steps: spraying a liquid to form a droplet layer on the surface to reduce temporarily the roughness; scanning the surface by emitting an incident light and receiving a reflected/refracted light to obtain an electric signal; and processing the electric signal to generate an output which carries with the profile or the defect information of the surface.
申请公布号 US2017052022(A1) 申请公布日期 2017.02.23
申请号 US201514858629 申请日期 2015.09.18
申请人 INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE 发明人 HUNG Kuo-Feng
分类号 G01B11/24;B05B9/03 主分类号 G01B11/24
代理机构 代理人
主权项 1. A surface profile measurement system with liquid atomization, comprising: a platform; a light source configured to emit an incident light; a photoelectric sensor configured to receive a reflected/refracted light to convert into an electric signal; a sprayer configured to spray liquid drops, a controller connected by electricity to activate the light source, the photoelectric sensor and the sprayer; and a processor connected by electricity to the controller to process the electric signal.
地址 HSINCHU TW