发明名称 |
HIGHLY REFLECTIVE SURFACE PROFILE MEASUREMENT SYSTEM WITH LIQUID ATOMIZATION AND THE METHOD THEREOF |
摘要 |
A highly reflective surface profile measurement system with liquid atomization and a method thereof are both provided. The method includes the following steps: spraying a liquid to form a droplet layer on the surface to reduce temporarily the roughness; scanning the surface by emitting an incident light and receiving a reflected/refracted light to obtain an electric signal; and processing the electric signal to generate an output which carries with the profile or the defect information of the surface. |
申请公布号 |
US2017052022(A1) |
申请公布日期 |
2017.02.23 |
申请号 |
US201514858629 |
申请日期 |
2015.09.18 |
申请人 |
INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE |
发明人 |
HUNG Kuo-Feng |
分类号 |
G01B11/24;B05B9/03 |
主分类号 |
G01B11/24 |
代理机构 |
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代理人 |
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主权项 |
1. A surface profile measurement system with liquid atomization, comprising:
a platform; a light source configured to emit an incident light; a photoelectric sensor configured to receive a reflected/refracted light to convert into an electric signal; a sprayer configured to spray liquid drops, a controller connected by electricity to activate the light source, the photoelectric sensor and the sprayer; and a processor connected by electricity to the controller to process the electric signal. |
地址 |
HSINCHU TW |