发明名称 半導体装置および電子回路装置、圧縮機
摘要 PROBLEM TO BE SOLVED: To solve a problem that contact failure between a semiconductor and a heat dissipation case is likely to occur due to mounting variation in semiconductors thereby to reduce reliability when a plurality of heat generating semiconductor elements are mounted on a printed circuit board and generated heat by the heat generating semiconductor element is dissipated by contacting the heat generating semiconductor elements with the heat dissipation case.SOLUTION: By sandwiching a second semiconductor element between a first semiconductor element 1 and a heat dissipation plate 7 to form a semiconductor having an integrated structure of the first semiconductor element and the second semiconductor element and the heat dissipation plate obtained by using fixing means, heat dissipation of the first semiconductor element and the second semiconductor element is successfully performed thereby to prevent an adverse effect caused by heat of the semiconductor device.
申请公布号 JP6082985(B2) 申请公布日期 2017.02.22
申请号 JP20130021888 申请日期 2013.02.07
申请人 パナソニックIPマネジメント株式会社 发明人 徳永 成臣
分类号 H01L23/40;H01L23/36;H05K7/20 主分类号 H01L23/40
代理机构 代理人
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