发明名称 |
Integrated circuit device including polycrystalline semiconductor film and method of manufacturing the same |
摘要 |
An IC device includes a polycrystalline silicon thin film interposed between a first level semiconductor circuit and a second level semiconductor circuit which are formed on a substrate and disposed to vertically overlap each other. The polycrystalline silicon thin film includes at least one silicon single crystal. The at least one silicon single crystal includes a flat horizontal portion, which provides an active region of the second level semiconductor device, and a pin-shaped protruding portion protruding from the flat horizontal portion toward the first level semiconductor device. |
申请公布号 |
US9576969(B2) |
申请公布日期 |
2017.02.21 |
申请号 |
US201615185020 |
申请日期 |
2016.06.17 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
Manorotkul Wanit;Shin Joong-han;Kuh Bong-jin;Choi Han-mei;Mikulik Dmitry |
分类号 |
H01L27/115;H01L21/02;H01L21/3205;H01L23/528 |
主分类号 |
H01L27/115 |
代理机构 |
Muir Patent Law, PLLC |
代理人 |
Muir Patent Law, PLLC |
主权项 |
1. A method of manufacturing an integrated circuit (IC) device, the method comprising:
forming a first level semiconductor device on a substrate; forming an inter-device dielectric layer that covers the first level semiconductor device; forming a pinhole that penetrates at least a portion of the inter-device dielectric layer; forming a polycrystalline silicon thin film comprising at least one silicon single crystal that extends from an inside of the pinhole up to an upper surface of the inter-device dielectric layer; and forming a second level semiconductor device on the polycrystalline silicon thin film by using the at least one silicon single crystal as an active region. |
地址 |
Yeongtong-gu, Suwon-si, Gyeonggi-do KR |