发明名称 Integrated circuit device including polycrystalline semiconductor film and method of manufacturing the same
摘要 An IC device includes a polycrystalline silicon thin film interposed between a first level semiconductor circuit and a second level semiconductor circuit which are formed on a substrate and disposed to vertically overlap each other. The polycrystalline silicon thin film includes at least one silicon single crystal. The at least one silicon single crystal includes a flat horizontal portion, which provides an active region of the second level semiconductor device, and a pin-shaped protruding portion protruding from the flat horizontal portion toward the first level semiconductor device.
申请公布号 US9576969(B2) 申请公布日期 2017.02.21
申请号 US201615185020 申请日期 2016.06.17
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 Manorotkul Wanit;Shin Joong-han;Kuh Bong-jin;Choi Han-mei;Mikulik Dmitry
分类号 H01L27/115;H01L21/02;H01L21/3205;H01L23/528 主分类号 H01L27/115
代理机构 Muir Patent Law, PLLC 代理人 Muir Patent Law, PLLC
主权项 1. A method of manufacturing an integrated circuit (IC) device, the method comprising: forming a first level semiconductor device on a substrate; forming an inter-device dielectric layer that covers the first level semiconductor device; forming a pinhole that penetrates at least a portion of the inter-device dielectric layer; forming a polycrystalline silicon thin film comprising at least one silicon single crystal that extends from an inside of the pinhole up to an upper surface of the inter-device dielectric layer; and forming a second level semiconductor device on the polycrystalline silicon thin film by using the at least one silicon single crystal as an active region.
地址 Yeongtong-gu, Suwon-si, Gyeonggi-do KR